DOI: https://doi.org/10.20998/2413-4295.2020.04.21
Ємнісний перетворювач на основі тонкоплівкової структури ITO/поліімід/Al2O3
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Dwivedi S. K., Vishwakarma M., Soni A. Advances and Researches on Non Destructive Testing: A Review. MaterialsToday: Proceedings, 2018, Vol. 5, no. 2, pp. 3690-3698, doi:10.1016/j.matpr.2017.11.620.
Guo S., Shah L., Ranjan R., Walbridge S., Gerlich A. Effect of quality control parameter variations on the fatigue performance of aluminum friction stir welded joints. International Journal of Fatigue, 2019, Vol. 118, pp. 150-161, doi:10.1016/j.ijfatigue.2018.09.004.
Gorkunov B. M., Tupa I. V., Zaitseva L. V., Khrypunov G. S., Zaitsev R. V., Khrypunova A. L. Metal Defectoscopy by the Capacitive Acoustic Method: The Physical Base Development. Journal of nano- and electronic physics, 2018, Vol. 7, no. 1, pp. 01038.
Bondarenko O. G. Determination of the actual area of dry acoustic contact in the system “transducer-product” in low-frequency defectoscopy. Methods and devices of quality control, 2019, Vol. 43, no. 2, pp. 5-15, doi:10.31471/1993-9981-2019-2(43)-5-15.
Myatezh A. V., Malozyomov B. V. Defectoscopy of conductive structures. International Conference "Actual Issues of Mechanical Engineering", Atlantis Press, 2019, pp. 435-440, doi:10.2991/aime-18.2018.83.
Sousa M. G., da Cunha A. F. Optimization of low temperature RF-magnetron sputtering of indium tin oxide films for solar cell applications. Applied Surface Science, 2019, Vol. 484, pp. 257-264, doi: 10.1016/j.apsusc.2019.03.275.
Yüzüak G. D., Coşkun Ö. D. The effect of annealing on the structural, electrical, optical and electrochromic properties of indium-tin-oxide films deposited by RF magnetron sputtering technique. Optik, 2017, Vol. 142, pp. 320-326, doi:10.1016/j.ijleo.2017.06.016.
Khrypunov G., Sokol E., Kudii D., Khrypunov M. The optimization of technology ITO layers for thin-film solar cells. 2018 14th International Conference on Advanced Trends in Radioelecrtronics, Telecommunications and Computer Engineering, Ukraine, 2018, pp. 393-398, doi:10.1109/TCSET.2018.8336227.
XiaoHui C., Tao X., DongBing L., QingGuo Y., BinQiang L., Mu L., XiaoYa L., Jun L. Graphical method for analyzing wide-angle x-ray diffraction. Review of Scientific Instruments, 2018, Vol. 89, no. 1, pp. 013904, doi:10.1063/1.5003452.
Kumar S., Mote V.D., Prakash R., Kumar V. X-ray Analysis of α-Al2O3 Particles by Williamson–Hall Methods. Materials Focus, 2016, Vol. 5, no. 6, pp. 545-549, doi:10.1166/mat.2016.1345.
Troyan P., Zhidik Yu., Zhidik E. Investigation of temperature stability of ITO films characteristics. IV International Young Researchers Conference “Youth, Science, Solutions: Ideas and Prospects”, Russia, 2018, pp. 03010, doi:10.1051/matecconf/201814303010.
Acharya J., Wilt J., Liu B., Wu J. Probing the Dielectric Properties of Ultrathin Al/Al2O3/Al Trilayers Fabricated Using in Situ Sputtering and Atomic Layer Deposition. ACS Appl. Mater. Interfaces, 2018, Vol. 10, no. 3, pp. 3112-3120, doi:10.1021/acsami.7b16506.
Пристатейна бібліографія ГОСТ
- Dwivedi S. K., Vishwakarma M., Soni A. Advances and Researches on Non Destructive Testing: A Review. MaterialsToday: Proceedings. 2018. Vol. 5. no. 2. pp. 3690-3698. doi:10.1016/j.matpr.2017.11.620.
- Guo S., Shah L., Ranjan R., Walbridge S., Gerlich A. Effect of quality control parameter variations on the fatigue performance of aluminum friction stir welded joints. International Journal of Fatigue. 2019. Vol. 118. pp. 150-161. doi:10.1016/j.ijfatigue.2018.09.004.
- Gorkunov B. M., Tupa I. V., Zaitseva L. V., Khrypunov G. S., Zaitsev R. V., Khrypunova A. L. Metal Defectoscopy by the Capacitive Acoustic Method: The Physical Base Development. Journal of nano- and electronic physics. 2018. Vol. 7. no. 1. pp. 01038.
- Bondarenko O. G. Determination of the actual area of dry acoustic contact in the system “transducer-product” in low-frequency defectoscopy. Methods and devices of quality control. 2019. Vol. 43. no. 2. pp. 5-15. doi:10.31471/1993-9981-2019-2(43)-5-15.
- Myatezh A. V., Malozyomov B. V. Defectoscopy of conductive structures. International Conference "Actual Issues of Mechanical Engineering". Atlantis Press, 2019. pp. 435-440. doi:10.2991/aime-18.2018.83.
- Sousa M. G., da Cunha A. F. Optimization of low temperature RF-magnetron sputtering of indium tin oxide films for solar cell applications. Applied Surface Science. 2019. Vol. 484. pp. 257-264. doi: 10.1016/j.apsusc.2019.03.275.
- Yüzüak G. D., Coşkun Ö. D. The effect of annealing on the structural, electrical, optical and electrochromic properties of indium-tin-oxide films deposited by RF magnetron sputtering technique. Optik. 2017. Vol. 142. pp. 320-326. doi:10.1016/j.ijleo.2017.06.016.
- Khrypunov G., Sokol E., Kudii D., Khrypunov M. The optimization of technology ITO layers for thin-film solar cells. 2018 14th International Conference on Advanced Trends in Radioelecrtronics, Telecommunications and Computer Engineering. Ukraine, 2018. pp. 393-398. doi:10.1109/TCSET.2018.8336227.
- XiaoHui C., Tao X., DongBing L., QingGuo Y., BinQiang L., Mu L., XiaoYa L., Jun L. Graphical method for analyzing wide-angle x-ray diffraction. Review of Scientific Instruments. 2018. Vol. 89. no. 1. pp. 013904. doi: 10.1063/1.5003452.
- Kumar S., Mote V.D., Prakash R., Kumar V. X-ray Analysis of α-Al2O3 Particles by Williamson–Hall Methods. Materials Focus. 2016. Vol. 5. no. 6. pp. 545-549. doi:10.1166/mat.2016.1345.
- Troyan P., Zhidik Yu., Zhidik E. Investigation of temperature stability of ITO films characteristics. IV International Young Researchers Conference “Youth, Science, Solutions: Ideas and Prospects”. Russia, 2018. pp. 03010. doi:10.1051/matecconf/201814303010.
- Acharya J., Wilt J., Liu B., Wu J. Probing the Dielectric Properties of Ultrathin Al/Al2O3/Al Trilayers Fabricated Using in Situ Sputtering and Atomic Layer Deposition. ACS Appl. Mater. Interfaces. 2018. Vol. 10. no. 3. pp. 3112-3120. doi:10.1021/acsami.7b16506.